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National Instruments PXIE-4142 Source Measurement Unit (SMU) module

The National Instruments PXIE-4142 is a four channel, four quadrant source measurement unit (SMU) primarily used to construct PXI systems that require voltage or current sources and measurement functions. With a measurement resolution of 100pA, it can achieve high-precision current measurement and meet the application scenarios that require high measurement accuracy. Supports four quadrant operation, provides positive and negative voltage and current, can simulate various electrical characteristics, and is suitable for testing multiple types of equipment.

National Instruments PXIE-4142 Source Measurement Unit (SMU) module

Specific parameters
Number of channels: 4 independent channels.
Voltage range: ± 24V per channel.
Current range: 150mA per channel.
Measurement resolution: 100pA.
Pulse width: 200ns.
Working temperature range: 0 ° C to 55 ° C.
Power requirements: The 12V power rail requires 2A current, and the 3.3V power rail requires 1.9A current.
Size: 0.8 inches x 5.1 inches x 8.5 inches (approximately 2.03 cm x 12.95 cm x 21.59 cm).
Weight: 14.53 ounces (approximately 412 grams).

Product Performance
High precision measurement: With a measurement resolution of 100pA, it can achieve high-precision current measurement and meet the application scenarios that require high measurement accuracy.
Four quadrant operation: supports four quadrant operation, can provide positive and negative voltage and current, can simulate various electrical characteristics, and is suitable for testing multiple types of equipment.
Integrated remote sensing function: All four channels are integrated with remote sensing function, which helps ensure accurate measurement results even with long test leads, reducing measurement errors caused by factors such as lead resistance.
Fast pulse output: A pulse width of 200ns enables fast pulse testing, suitable for applications that require rapid excitation and measurement of equipment, such as testing of certain high-speed semiconductor devices.
Built in protection function: It has built-in voltage and current limit protection, which can prevent the tested equipment from being damaged due to overvoltage or overcurrent, improving the safety and reliability of the testing system.
Ideal SMU response: Using NI SourceAdapt digital control loop technology, the transient response of SMU can be customized and adjusted to achieve the best response to any given load, shorten stability time, reduce testing time, and protect the tested equipment to ensure system stability.




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