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National Instrument PXIE-6556 Digital waveform generator/analyzer

The National Instruments PXIE-6556 is a powerful digital waveform generator/analyzer based on the PXI Express X4 architecture. It has 24 single ended digital pins, each with a PPMU (per pin parameter unit) function that can be individually programmed, similar to force and measurement units, and can drive and measure current and voltage. It can create or obtain digital information, easily complete DC parameter measurement, and is suitable for verification and production testing. With sub hertz frequency and 30ps timing resolution per pin, it ensures high-precision measurement and control. It can be integrated with other devices such as power supplies, digitizers, and switches to form a multifunctional and high-performance mixed signal testing system.

National Instrument PXIE-6556 Digital waveform generator/analyzer

Number of channels: 24 channels.
Maximum clock rate: 200MHz.
Voltage level: -2V to 7V or -1V to 7V.
Memory: Part number 78194-01 has 8MB of memory per channel, and part number 78194-02 has 64MB of memory per channel.
Maximum data transmission rate: 200Mbit/s.
Input/output protection range: -3V to 8.5V.
Size: 21.6cm × 2.0cm × 13.0cm.
Weight: 28 ounces.
I/O connector types: SMA jack, Combicon, and 68 pin VHDCI.
Supported software: NI HSDIO driver software (version 1.8 and above), National Instruments Measurement and Automation Explorer (MAX) tool.

Product Performance
High precision measurement control: With sub hertz frequency and 30ps timing resolution per pin, it can ensure high-precision measurement and control.
Rich functional features: including real-time hardware comparison, data latency, scripting, onboard high-resolution clock, etc. It also has timing and synchronization functions, as well as the ability to use 64Mbit memory (per channel) and script functions to complete advanced linking, information flow, and looping.
Flexible integration capability: It can be integrated with other devices such as power supplies, digitizers, and switches to form a multifunctional and high-performance mixed signal testing system.
Advanced ATE capability: It has advanced automatic test equipment (ATE) functions such as active load, tight channel skew, and external SMU (source measurement unit) integration, and performs well in various testing applications.




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