HP E1740A Time interval analyzer module

HP E1740A Time interval analyzer module

SPECIFIC PARAMETERS​

Brand HP (Keysight/Agilent)​

Product Series VXI Bus High-Precision Test Module Series​

Product Type 2-slot C-size VXI Time Interval Analyzer Module​

Working Voltage 18-32VDC VXI Backplane Power Supply​

Working Temperature -20℃ to +60℃​

Storage Temperature -40℃ to +70℃​

Time Measurement Range 500ps to 10s​

Time Resolution 100fs​

Number of Input Channels 2​

Input Impedance 50 Ohms​

Trigger Modes Single Trigger Repeat Trigger External Trigger​

Measurement Output Rate 6500 times per second​

Frequency Resolution 10 Digits​

Memory Specification 512KB​

Communication Interface VXI Backplane Bus GPIB IEEE-488 Support MXIbus Expansion​

Size 6U Height C-size VXI Chassis 2-slot Specification 233.4mm Depth​

Weight 2.27kg​

Supported Protocols SCPI VXI Plug-and-Play VPP IEEE 488.2​

Power Consumption 20W​

Safety Certification CE FCC Class A​

Vibration Resistance 10-2000Hz@5g RMS​

Shock Resistance 100g@11ms Pulse​

PRODUCT PERFORMANCE​

Equipped with an ultra-high-precision timing detection unit, 100fs resolution can realize nanosecond-level and even femtosecond-level time interval measurement​

Equipped with dual input channels, supports multi-signal synchronous acquisition and comparative analysis to meet complex timing verification needs​

Supports multiple types of trigger modes, which can accurately capture signal timing characteristics under specific working conditions​

Compatible with SCPI standard commands, can realize automated test processes through programming to improve test efficiency​

Built-in dedicated data processing unit, 6500 times per second measurement output rate can meet high-frequency timing data acquisition​

As the core component of the E1725C VXI system, it can seamlessly cooperate with the same series of modules to build a complete test system​

Equipped with a variety of dedicated analysis software packages, which can specifically complete SONET/SDH jitter analysis, network synchronization verification and other tasks​

Adopt industrial-grade wide-temperature components, which can operate stably in test environments with strong electromagnetic interference and high-low temperature fluctuations​

Support online firmware upgrade, which can expand the adaptability to new timing test scenarios​

Has a complete self-test function, which can real-time feedback the module working status through panel indicators​